- XRD Ölçüm Sistemi
- PL Haritalama Sistemi
- ECV
- Sheet Rezistance
- Hall Etkisi Ölçüm Sistemi (HEMS)
- Elipsometre
- SEM
- Spektrofotometre
- Probe-station
- Profilmetre
- Optik Mikroskop
- LIV Ölçümü
- Proses Dizayn
- Rapid Thermal Processing
- Ion Beam Asisted Di Electric Coating
- Mask Aligner
- Mask Writer
- Laser Lithograpy Photo Mask Production
- Wafer Dicing (2" to 6")
- Wafer Scribe and Breaker
- PECVD coating
- Wafer Grinding & Polishing
- Metal Coatings (e-beam evaporator)
- Sputter Coatings
- ICP
- RIE