Services


  • XRD Measurement System
  • PL Mapping System
  • ECV
  • Sheet Rezistance
  • Hall Effect Measurement System (HEMS)
  • Elipsometre
  • SEM
  • Spectrophotometer
  • Probe-station
  • Profilmeter
  • Optical Microscope
  • LIV Measurement
  • Process Design
  • Rapid Thermal Processing
  • Ion Beam Asisted Di Electric Coating
  • Mask Aligner
  • Mask Writer
  • Laser Lithograpy Photo Mask Production 
  • Wafer Dicing (2" to 6")
  • Wafer Scribe and Breaker
  • PECVD coating 
  • Wafer Grinding & Polishing
  • Metal Coatings (e-beam evaporator)
  • Sputter Coatings
  • ICP
  • RIE
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