Characterization


  • XRD Measurement System
  • PL Mapping System
  • ECV
  • Sheet Rezistance
  • Hall Effect Measurement System (HEMS)
  • Ellipsometer
  • SEM
  • Spectrophotometer
  • Probe-station
  • Profilmeter
  • Optical Microscope
  • LIV Measurement
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